Anomalous Temperature Dependence of Lattice Constant in Silicon Crystals
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概要
- 論文の詳細を見る
The lattice constant of silicon single-crystals grown with the floating-zoneand the Czochralski methods have been measured as a function of tenvperatureby means of a high-angle double-crystal X-ray diffractometer with a relativeaccuracy of 1 part in l0'. Anomalous temperature dependence and anomalousincrease in Bragg peak widths are observed around 200 K only when the measure-ment is made with lowering temperature, Time anomaly dintinishes whenthermal cycles between 300 and 100 K are repeated, though it is still appreciableat the third cycle.
- 社団法人日本物理学会の論文
- 1979-03-15
著者
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OKAZAKI Atsushi
Department of Anesthesiology, Juntendo University Shizuoka Hospital
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Okazaki Atsushi
Department Of Physics Kyushu University
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Okazaki Atsushi
Department Of Anesthesiology Juntendo University Shizuoka Hospital
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SUZUKI Yoshifumi
Department of Internal Medicine, Social Insurance Chuo General Hospital
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OHAMA Nobuhiko
Department of Physics, Kyushu University
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Ohama Nobuhiko
Department Of Physics Faculty Of Science Kyusyu University
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SAKASHITA Hirohumi
Department of Physics, Kyushu University
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HOSOGI Shinya
Department of Physics,Kyushu University
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Hosogi Shinya
Department Of Physics Kyushu University
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Suzuki Yoshifumi
Department Of Electrical And Electronic Engineering Kanagawa Institute Of Technology
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Suzuki Yoshifumi
Department Of Physics Kyushu University
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Sakashita Hirohumi
Department Of Physics Kyushu University:(present Address)toshiba Corporation
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Suzuki Yoshifumi
Department Of Diabetes And Metabolic Diseases Asahi General Hospital
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