Accurate Measurement of Lattice Constants in a Wide Range of Temperature : Use of White X-Rays and Double-Crystal Diffractometry

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概要

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• The use of double-crystal diffractometry using white incident X-rays is proposed for measurements of lattice constants of common, not perfect crystals in a wide range of temperatures. A detailed experimental procedure is presented. Measurements with the full width at half maximum of 0.1° in Bragg peaks can be made at θ=88° without any particular difficulty for many crystals mounted in a cryostat (or thermostat). The accuracy of the change of the lattice constant determined by these measurements is about 10^<-5> which is much better than that obtained by the conventional diffraction methods. Applications to the measurement of anomalies at the phase transition are emphasized. As an example the results on KNiF_3 are shown.

• 社団法人応用物理学会の論文
• 1973-06-05

著者

• Okazaki Atsushi

  Department Of Anesthesiology Juntendo University Shizuoka Hospital

• Kawaminami Masaru

  Department Of Physics College Of Liberal Arts Kagoshima University

• OKAZAKI Atsushi

  Department of Physics, Kyushu University

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