Discriminative Imaging of Local Crystalline Density and Thickness Variation in Strained Natural Rubber by Spectroscopic X-Ray Scattering Topography
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概要
- 論文の詳細を見る
X-ray spectroscopic scattering topography using an energy dispersive solid state detector has been applied to discriminate a local crystallization effect from the influence of thickness variation in strained natural rubber. ZnKα X-rays which are emitted from the zinc oxide additive are selected in the multichannel spectra to provide a thickness distribution map in the specimen. With appropriate calibration we could measure the distribution of thickness quantitatively, while X-rays with a longer wavelength than ZnKα are employed to form the X-ray topograph indicating the degree of crystallization.
- 社団法人応用物理学会の論文
- 1995-11-01
著者
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Chikaura Yoshinori
Department Of Physics Faculty Of Engineering Kyushu Institute Of Technology
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Chikaura Yoshinori
Department Of Applied Science For Integrated System Engineering Graduate School Of Engineering Kyush
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Suzuki Yoshifumi
Department Of Electrical And Electronic Engineering Kanagawa Institute Of Technology
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UDAGAWA Yoshitaka
The Yokohama Rubber Co., Ltd.
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Suzuki Yoshifumi
Department Of Physics Faculty Of Engineering Kyushu Institute Of Technology
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Udagawa Yoshitaka
The Yokohama Rubber Co. Ltd.
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Suzuki Yoshifumi
Department Of Diabetes And Metabolic Diseases Asahi General Hospital
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