Extinction of X-Ray Topographic Images of Copper Precipitates in Silicon Single Crystals
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1980-01-05
著者
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CHIKAURA Yoshinori
Department of Materials Science, Faculty of Engineering, Kyushu Institute of Technology
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Kishimoto Katsumi
Department Of Physics Kyushu Institute Of Technology:(present Address)hitachi Ohme Electronics Inc.
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Chikaura Yoshinori
Department Of Applied Science For Integrated System Engineering Graduate School Of Engineering Kyush
関連論文
- Energy-Dispersive Synchrotron Radiation Topographic Observation of InAs/GaAs Lattice-Mismatched Layer
- X-ray Penetration Depth for Large Lattice-Mismatched Heteroepitaxial Layer by Dynamical Diffraction Theory using Computer Simulation
- Laue-Case Plane Wave Topography Using Synchrotron Radiation to Reveal Microdefects in a Thinned Silicon Crystal
- Observation of Microdefects in Thin Silicon Crystals by Means of Plane-Wave Topography Using Synchrotron X-Radiation
- Extinction of X-Ray Topographic Images of Copper Precipitates in Silicon Single Crystals
- Depth-Sensitive X-Ray Scattering Topographic Observation of InAs Grown by Molecular Beam Epitaxy on GaAs
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- X-Ray Topography of Magnetic Domains in Iron Whisker Crystals
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- X-Ray Orientation Topography
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- Morphology of Microdefects in As-Grown Thinned Silicon Crystals Observed by Synchrotron X-Radiation Plane-Wave Topography