エネルギーフィルター型RHEED図形内の振動相関熱散漫散乱

概要

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Electron thermal diffuse scattering constructs the background intensity in electron diffraction pattern. The scattering component accompanied with vibrational correlation between the nearest neighbor atoms in crystal, which is named as correlated thermal diffuse scattering (CTDS), is also included in the background. Recently a new direct structural analysis method has been proposed in medium electron energy diffraction (MEED) by extracting CTDS intensity distribution from the background by means of energy filter. In order to examine the existence of CTDS intensity distribution in the case of reflection high-energy electron diffraction (RHEED), the energy filtered (EF-) RHEED patterns from Si(001)2x1 clean surface were taken by CCD camera and the images were processed by personal computer in order to eliminate the background profile. The preliminary result of CTDS pattern has been obtained for the first time from EF-RHEED. An appropriate distance between the nearest neighbor Si atoms was deduced from Fourier transformation of the CTDS pattern. It is found that the direct structural analysis using CTDS in EF-RHEED is possible as a complementary method to dynamical structural analysis using rocking curves of diffraction spot intensities.
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