Ti/Pt/Ti/Cu-Metallized Interconnects for GaN High-Electron-Mobility Transistors on Si Substrate
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概要
- 論文の詳細を見る
- 2012-06-25
著者
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Chang Edward
Institute Of Material Science And Engineering National Chiao Tung University
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Chang Chia-hua
Department Of Materials Science And Engineering National Chiao-tung University
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Kuo Tza-yao
Institute Of Materials Science And Engineering National Chiao-tung University
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LIN Yueh-Chin
Institute of Materials Science and Engineering, National Chiao-Tung University
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CHUANG Yu-Lin
Institute of Materials Science and Engineering, National Chiao-Tung University
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WU Chien-Hua
Department of Physical Electronics, National Chung-Cheng University
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CHANG Chia-Hua
Institute of Materials Science and Engineering, National Chiao-Tung University
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HUANG Kuan-Ning
Institute of Materials Science and Engineering, National Chiao-Tung University
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Wu Chien-hua
Department Of Physical Electronics National Chung-cheng University
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Chuang Yu-lin
Institute Of Materials Science And Engineering National Chiao-tung University
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Huang Kuan-ning
Institute Of Materials Science And Engineering National Chiao-tung University
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