Observation of single-electron pump operation with one ac gate bias in phosphorous-doped Si wires
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概要
- 論文の詳細を見る
- 2006-09-13
著者
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ONO Y.
NTT Basic Research Laboratories, NTT Corporation
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Tabe M.
Research Institute Of Electronics Shizuoka University
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Nuryadi R.
Research Institute Of Electronics Shizuoka University
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INOKAWA H.
Research Institute of Electronics, Shizuoka University
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Ikeda H.
Research Institute Of Electronics Shizuoka University
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MORARU D.
Research Institute of Electronics, Shizuoka University
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YOKOI K.
Research Institute of Electronics, Shizuoka University
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Moraru D.
Research Institute Of Electronics Shizuoka University
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Ono Y.
Ntt Basic Research Laboratories Ntt Corporation
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