Direct Observation of Freeze-out Effect in Si by Kelvin Probe Force Microscope
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概要
- 論文の詳細を見る
- 2007-09-19
著者
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Tabe M.
Research Institute Of Electronics Shizuoka University
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Nuryadi R.
Research Institute Of Electronics Shizuoka University
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LIGOWSKI M.
Research Institute of Electronics, Shizuoka University
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ICHIRAKU A.
Research Institute of Electronics, Shizuoka University
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ANWAR M.
Research Institute of Electronics, Shizuoka University
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JABLONSKI R.
Division of Sensors and Measuring Systems, Faculty of Mechatronics, Warsaw University of Technology
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Ligowski M.
Research Institute Of Electronics Shizuoka University
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Ichiraku A.
Research Institute Of Electronics Shizuoka University
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Anwar M.
Research Institute Of Electronics Shizuoka University
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Jablonski R.
Division Of Sensors And Measuring Systems Faculty Of Mechatronics Warsaw University Of Technology
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