Design Control of Random Dopant-induced Multiple-Tunnel-Junction Arrays for Turnstile Operation

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概要

• 論文の詳細を見る
• 2007-09-19

著者

• Tabe M.

  Research Institute Of Electronics Shizuoka University

• Ikeda H.

  Research Institute Of Electronics Shizuoka University

• MORARU D.

  Research Institute of Electronics, Shizuoka University

• YOKOI K.

  Research Institute of Electronics, Shizuoka University

• Moraru D.

  Research Institute Of Electronics Shizuoka University

関連論文

• Photon-induced single-hole-tunneling current modulation in Si multiple-tunnel-junction field-effect transistor
• Photo Illumination Effect on Single-Electron-Tunneling Current Through a Thin Bicrystal SOI FET
• Direct Observation of Freeze-out Effect in Si by Kelvin Probe Force Microscope
• Design Control of Random Dopant-induced Multiple-Tunnel-Junction Arrays for Turnstile Operation
• Observation of single-electron pump operation with one ac gate bias in phosphorous-doped Si wires
• Fowler-Nordheim current oscillations in Si(111)/SiO_2/twisted-Si(111) tunneling structures

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