ONO Y. | NTT Basic Research Laboratories, NTT Corporation

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概要

• ONO Y.の詳細を見る
• 同名の論文著者
• NTT Basic Research Laboratories, NTT Corporationの論文著者

関連著者

• ONO Y.

  NTT Basic Research Laboratories, NTT Corporation

• Ono Y.

  Ntt Basic Research Laboratories Ntt Corporation

• NISHIGUCHI K.

  NTT Basic Research Laboratories, NTT Corporation

• FUJIWARA A.

  NTT Basic Research Laboratories, NTT Corporation

• Nishiguchi K.

  Ntt Basic Research Laboratories Ntt Corporation

• Inokawa H.

  Shizuoka Univ.

• Fujiwara A.

  Ntt Basic Research Laboratories Ntt Corporation

• YAMAGUCHI H.

  NTT Basic Research Laboratories, NTT Corporation

• Takahashi Y.

  Hokkaido University

• Wu N.

  Institute Of Semiconductor Chinese Academy Of Sciences

• Zhang W.

  NTT Basic Research Laboratories

• Inokawa H.

  Shizuoka University

• INOKAWA H.

  Research Institute of Electronics, Shizuoka University

• Fujisawa T.

  NTT Basic Research Laboratories

• Khalafalla M.

  Ntt Basic Research Laboratories Ntt Corporation

• Tabe M.

  Research Institute Of Electronics Shizuoka University

• Nuryadi R.

  Research Institute Of Electronics Shizuoka University

• Liu H.

  NTT BRL

• Hirayama Y.

  SORST-JST

• TAKAHASHI Y.

  Graduate School of Information Science and Technology, Hokkaido University

• INOKAWA H.

  NTT Basic Research Laboratories, NTT Corporation

• HORIGUCHI S.

  Akita university

• Ikeda H.

  Research Institute Of Electronics Shizuoka University

• MORARU D.

  Research Institute of Electronics, Shizuoka University

• YOKOI K.

  Research Institute of Electronics, Shizuoka University

• Moraru D.

  Research Institute Of Electronics Shizuoka University

もっと見る 閉じる

著作論文

• Identification of Single and Coupled Acceptors in Silicon Nano Field-Effect Transistors
• 21aTA-7 Single-electron transport through single and double silicon quantum dots
• Transfer and Detection of Single Electrons using Metal-Oxide-Semiconductor Field-Effect-Transistors(Session 8B Emerging Devices and Technologies II,AWAD2006)
• Transfer and Detection of Single Electrons using Metal-Oxide-Semiconductor Field-Effect-Transistors(Session 8B Emerging Devices and Technologies II)
• Infrared detection with silicon nano transistors
• Charge-state control of phosphorus donors in SOI MOSFET
• Observation of single-electron pump operation with one ac gate bias in phosphorous-doped Si wires

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