Measurement of Two-Qubit States using a Two-Island Single Electron Transistor

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概要

• 論文の詳細を見る
• 2004-09-15

著者

• TANAMOTO Tetsufumi

  Corporate R&D Center, Toshiba Corporation

• FUJITA Shinobu

  Corporate R&D Center, Toshiba Corporation

• Tanamoto Tetsufumi

  Corporate R&d Center Toshiba Corporation

• Fujita Shinobu

  Corporate R&d Center Toshiba Corporation

• HU Xuedong

  Department of Physics, University at Buffalo, SUNY

• Hu Xuedong

  Department Of Physics University At Buffalo Suny

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• Measurement of Two-Qubit States using a Two-Island Single Electron Transistor
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• Robustness of Charge-Qubit Cluster States to Double Quantum Point Contact Measurement
• Steady-State Solution for Dark States Using a Three-Level System in Coupled Quantum Dots
• Detection of a Charged Two-Level System by Using the Kondo and the Fano--Kondo Effects in Quantum Dots
• Detection of a Charged Two-Level System by Using the Kondo and the Fano-Kondo Effects in Quantum Dots (Special Issue : Solid State Devices and Materials)

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