A Thermal Resistance Measurement of HBT with Pulsed Current I-V Setup and Its Scalability with the Total Emitter Area
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概要
- 論文の詳細を見る
- 2000-08-28
著者
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Park Hyun-min
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology (kaist)
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Park Hyun-min
Department Of Electrical Engineering And Computer Science (eecs) Korea Advanced Institute Of Science
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Hong Songcheol
Department Of Electrical Engineering And Computer Science (eecs) Korea Advanced Institute Of Science
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CHEON Sang-Hoon
Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST)
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Cheon Sang-hoon
Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology (kaist)
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HONG Songcheol
Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST)
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