Depth-Enhanced Integral Imaging with a Stepped Lens Array or a Composite Lens Array for Three-Dimensional Display
スポンサーリンク
概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-08-15
著者
-
Park J‐h
Advanced Technology Development Team Memory Division Semiconductor Business Samsung Electronics Co.
-
Park June-hyoung
Center For Near-field Atom-photon Technology Seoul National University
-
Lee Byoungho
National Research Laboratory Of Holography Technologies School Of Electrical Engineering Seoul Natio
-
PARK Jae-Hyeung
National Research Laboratory of Holography Technologies, School of Electrical Engineering, Seoul Nat
-
CHOI Heejin
National Research Laboratory of Holography Technologies, School of Electrical Engineering, Seoul Nat
-
HONG Jisoo
National Research Laboratory of Holography Technologies, School of Electrical Engineering, Seoul Nat
関連論文
- Influence of Defect Segregation on the Electrical Properties of Nb-doped SrTiO_3 Grain Boundary Layer
- Novel Micromachined Coplanar Waveguide Transmission Lines for Application in Millimeter-Wave Circuits
- Viewing Angle Enhancement of Three-Dimension/Two-Dimension Convertible Integral Imaging Display Using Double Collimated or Noncollimated Illumination
- Selective-Area Micropatterning of Liquid-Phase Epitaxy-Grown Iron Garnet Films
- Numerical Analysis of One-Dimensional Magnetophotonic Crystals with an Active Layer of a Highly Bi-Substituted Iron Garnet
- Degradation Phenomenon of p+to p+ Isolation Characteristics Caused by Carrier Injection in a High-Voltage Process
- Process Design for Preventing the Gate Oxide Thinning in the Integration of Dual Gate Oxide Transistor
- New STI Scheme to Compensate Gate Oxide Thinning at STI Corner Edge for the Devices Using Thick Dual Gate Oxide
- Novel Capacitor Structure Using Sidewall Spacer for Highly Reliable Ferroelectric Random Access Memory Device
- Robust Three-Metallization Back End of Line Process for 0.18μm Embedded Ferroelectric Random Access Memory
- Influence of Grain boundary Layers on the Dielectric Relaxation of Nb-Doped SrTiO_3
- Scaling of Three-Dimensional Integral Imaging
- Depth-Enhanced Integral Imaging with a Stepped Lens Array or a Composite Lens Array for Three-Dimensional Display
- Near-Field Optical Recording by Reflection-Mode Near-Field Scanning Optical Microscope : Submicron-Sized Marks and Their Thermodynamic Stability
- The Hydrophilization of Process Wafers in Dilute Hydrogen Peroxide Solutions and Ozonated Deionized Water and Its Effects on Defects and Gate Oxide Integrity
- Soft Decision Decoding for Holographic Memories with Intrapage Intensity Variations
- Holographic Approach to Record and Retrieve Subwavelength-Size Objects Using Optical Near-Field
- Depth-Enhanced Integral Imaging with a Stepped Lens Array or a Composite Lens Array for Three-Dimensional Display
- Scaling of Three-Dimensional Integral Imaging