TRIBOLOGY, FLUID DYNAMICS AND REMOVAL RATE CHARACTERIZATION OF NOVEL SLURRIES FOR ILD POLISH APPLICATIONS
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概要
- 論文の詳細を見る
- 2001-09-22
著者
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PHILIPOSSIAN Ara
Department of Chemical and Environmental Engineering University of Arizona
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Rogers C
Tufts Univ. Ma Usa
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ROGERS Chris
Department of Mechanical Engineering Tufts University
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LU Joseph
Department of Mechanical Engineering Tufts University
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Rogers Chris
Department Of Crop Soil And Environmental Sciences University Of Arkansas
関連論文
- Role of Slurry Flow Rate and Solids Content on Critical Tribological and Fluid Dynamics Attributes of ILD CMP
- Slurry Utilization Efficiency Studies in Chemical Mechanical Planarization
- Characterization of Slurry Residues in Pad Grooves for Diamond Disc and High Pressure Micro Jet Pad Conditioning Processes
- TRIBOLOGY, FLUID DYNAMICS AND REMOVAL RATE CHARACTERIZATION OF NOVEL SLURRIES FOR ILD POLISH APPLICATIONS
- Frictional and Removal Rate Studies of Silicon Dioxide and Silicon Nitride CMP Using Novel Cerium Dioxide Abrasive Slurries
- Dependence of Oxide Pattern Density Variation on Motor Current Endpoint Detection during Shallow Trench Isolation Chemical Mechanical Planarization
- The Spectral Fingerprints and the Sounds of Chemical Mechanical Planarization Processes
- Analysis of Formation of Pad Stains in Copper Chemical Mechanical Planarization
- Slurry Utilization Efficiency Studies in Chemical Mechanical Planarization
- Effect of Pad Surface Micro-Texture on Removal Rate during Interlayer Dielectric Chemical Mechanical Planarization Process
- The effect of periphyton stoichiometry and light on biological phosphorus immobilization and release in streams
- Tribological, Thermal, and Kinetic Characterization of 300-mm Copper Chemical Mechanical Planarization Process
- Analysis of A Novel Slurry Injection System in Chemical Mechanical Planarization
- Characterization of Slurry Residues in Pad Grooves for Diamond Disc and High Pressure Micro Jet Pad Conditioning Processes
- Fundamental Tribological and Removal Rate Studies of Inter-Layer Dielectric Chemical Mechanical Planarization