The Study on Ferromagnetic Resonance Linewidth for NM/80NiFe/NM (NM = Cu, Ta, Pd and Pt) Films
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概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-02-01
著者
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遠藤 康夫
高エ研
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ANDO Yasuo
Department of Applied Physics, Graduate School of Engineering, Tohoku University
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MIYAZAKI Terunobu
Department of Applied Physics, Graduate School of Engineering, Tohoku University
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Endoh Yasuo
Core Research For Evolutional Science And Technology (jrcat) : Department Of Physics Tohoku Universi
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Endoh Yasuo
Physics Department Granduate School Of Science Tohoku University
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Ando Yasuo
Department Of Applied Physics Graduate School Of Engineering Tohoku University
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Miyazaki Terunobu
Department Of Applied Physics Faculty Of Engineering Tohoku University
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Mizukami Shigemi
Wpi Advanced Institute For Materials Research Tohoku University
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MIZUKAMI Shigemi
Department of Applied Physics, Graduate School of Engineering, Tohoku University
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Ando Y
Tokyo Univ. Information Sci. Chiba Jpn
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Miyajima Toyoo
Tohoku Univ. Sendai Jpn
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