X-Ray Photoelectron Spectroscopy Study of Junction Interface in In/BaRbBiO Films

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概要

• 論文の詳細を見る
• Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
• 1998-05-01

著者

• KISHIDA Satoru

  Department of Electronics, Faculty of Engineering, Tottori University

• TOKUTAKA Heizo

  Department of Electronics, Faculty of Engineering, Tottori University

• Kishida S

  Opto-electronics Research Laboratories Nec Corporation

• Toda Fumihiko

  Oki Electric Industry Co. Ltd.

• YAMADA Tomoyuki

  Oki Electric Industry Co., Ltd.

関連論文

• XPS Studies of Bi-Sr-Ca-Cu-O Single Crystal and Ceramics Surfaces
• Surface Analysis of YBa_2Cu_3O_x and Bi-Sr-Ca-Cu-O Superconductors by Auger Electron Spectroscopy
• Effects of Water on the Resistance-Temperature Characteristics of YBa_2Cu_3O_ Oxides : Electrical Properties of Condensed Matter
• Effects of Preparation conditions and Mechanical Polishing on the Superconducting Behavior of High-T_c Oxide Y_1Ba_2Cu_3O_
• Direct Comparison of Fine Structure on Ti L_3 Threshold by Disappearance Potential and Auger Electron and Soft X-Ray Appearance Potential Spectroscopies
• Crystal Growth of Bi-Sr-Ca-Cu-O (c_0=39Å) Single Crystals
• Off-Angle SiC(0001) Surface and Cu/SiC Interface Reaction
• LEED-AES and XPS Studies of Bi-Sr-Ca-Cu-O Single Crystal Surfaces
• Surface of Bi_2Sr_2CaCu_2O_y Single Crystals Heated in Air
• Growth of Bi_2Sr_2CaCu_2O_y Single Crystals Using a Vertical Bridgmam Method
• A Hole Trap Center Related to the 2.361 eV Bound Exciton Emission in ZnTe Single Crystals
• X-Ray Photoelectron Spectroscopy Studies of 7 K-Phase Bi-System Single Crystals
• The Comparison of the Background Removal Methods in XPS Spectra
• XPS Studies of 80 K-Phase Bi-Sr-Ca-Cu-O Single Crystals
• LEED-AES Observations of 7 K- and 80 K-phase Bi-Sr-Ca-Cu-O Single Crystals
• A Micro-Quantitative AES Analysis Using SEM-SAM Apparatus : Applied to Ag/Si Interfaces on Si(111) and Si(100) Surfaces
• X-Ray Photoelectron Spectroscopy Study of Junction Interface in In/BaRbBiO Films
• Characteristics of TiN Films Sputtered under Optimized Conditions of Metallic Mode Deposition
• Effect of O^+_2 and O^+ on the Growth of Bi_2Sr_2Ca_Cu_nO_y Superconductimg Films in RF Magnetron Sputtering
• Effects of He Gas Addition on the Production of Active Particles in rf Magnetron Sputtering
• Optimization of Contact Process with Monte Carlo Study for Advanced CMOS Devices
• Optimization of Contact Process with Monte-Carlo Study for Advanced CMOS Devices
• Polarization Dependence of Electric Field Intensity Distributions in Photoresist Films
• Preparation of As-Deposited 80 K-Phase Bi-Sr-Ca-Cu-O Films by RF Mgnetron Sputtering
• Monolayer Halftone Phase-Shifting Mask for KrF Excimer Laser Lithography
• Effect of Bi_2Sr_2CaCu_2O_y Single Crystal Surfaces on Contact Resistance
• Observation of Josephson Junctionlike Behavior in Single-Crystal (Bi, Pb)_2Sr_2CaCu_2O_y
• Theoretical Analysis of Amorphous-Silicon Field-Effect-Transistors
• Short-Term Prediction of Oil Temperature Change of Outdoor Transformer by Self-Organizing Map(SOM) (論文特集 自己組織化マップとその応用)
• SOM an approach to Data Mining of Power Transformer Database
• Thin Film Growth of Ag on KCI Studied by LEED-AES Experiments
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• X-Ray Photoelectron Spectroscopy Study of Junction Interface in In/BaRbBiO Films

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