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Ulsi Process Technology Development Center Semiconductor Company Matsushita Electronics Corporation | 論文
- Preparation of PbTiO_3 Thin Films by Ion- and Photoassisted Evaporation
- Preparation and Characterization of Pb-Based Ferroelectric Thin Films : Thin Films
- Electrical Transport and Electron Spin Resonance in Electron-Beam-Irradiated Polyacetylene in the Presence of SF_6 Gas
- Compound-Source Molecular Beam Epitaxy for ZnCdSe/ZnSSe/ZnMgSSe Laser Structure
- Metal-Organic Chemical Vapor Deposition of HfO_2 by Alternating Supply of Tetrakis-Diethylamino-Hafnium and Remote-Plasma Oxygen
- Enhancement of Electrical Conductivity of Polyacetylene by Electron Beam Irradiation in the Presence of Dopant
- Photoluminescence of Polyacetylene in Near Infrared
- Optical Absorption of Yba_2Cu_3O_ and ErBa_2Cu_3O_ Crystals due to Interband Transition : Electrical Properties of Condensed Matter
- Optical Reflectivity of Single Crystals of YBa_2Cu_3O_ and ErBa_2Cu_3O_
- Terminating Structure of Plasma-Assisted Molecular Beam Epitaxial GaN{0001} Film Surface Identified by Coaxial Impact Collision Ion Scattering Spectroscopy
- Identification of Surface Atoms of LiGaO_2(001) Substrate for Hexagonal GaN Film by Coaxial Impact Collision Ion Scattering Spectroscopy
- Superconducting Bi_2Sr_2CaCu_2O_ Single Films Grown on SrTiO_3 Substrate by the Liquid Phase Epitaxial Method
- Preparation of Single Crystals Containing the High-T_c (above 100 K) Phase of a Bi-Sr-Ca-Cu-O Superconductor
- Synthesis and Decomposition of the High-T_c Phase of a Pb-Doped Bi-Sr-Ca-Cu-O Superconductor
- A New Method for Improving the Superconducting Transition Temperature of Platy ErBa_2Cu_3O_ Single Crystals
- Growth of YBa_2Cu_3O_ Single Crystals from the High Temperature Solution
- Growth of (La_Sr_x)_2CuO_ Crystals from High Temperature Solution
- Optimization of Single Crystal Preparation of Bi_2Sr_2CaCu_2O_x Superconductor by the Travelling Solvent Floating Zone Method
- Relationship between Water Diffusivity of Dielectric Films and Accelerated Hot Carrier Degradation Caused by Water
- Raman Study of Ring Structures of Chemical Vapor Deposited SiO_2 Thin Films