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Research Laboratory for Surface Science, Faculty of Science, Okayama University | 論文
- Soft X-Ray Emission Spectroscopy (SXES) Study of the Valence Band Electronic Structure of a Au-Si Alloy
- Valence Band Electronic State of Transition-Metal Silicide TiSi_2 Studied by Soft X-Ray Emission Spectroscopy (SXES)
- Construction of a Soft X-Ray Emission Spectroscopy (SXES) Apparatus and Its Application for Study of Electronic and Atomic Structures of a Multilayer System
- Contribution of the Si s Electronic State to the Density of State of CoSi_2 at Fermi Energy by Soft X-Ray Emission Spectroscopy
- Structual Studies of Poly(Fluoroalkyl Methacrylate)s and Poly(Fluoroalkyl α-Fluoroacrylate)s
- Transmission Electron Microscopic Study of the Surface and Interface of Carbonized-Layer/Si(100)
- Analysis of Nanostructure Formation Using Photon/Electron Spectroscopies: Cu on SiC Substrates
- Influence of Interface Barrier on Lateral Transport Properties for Metal/Semiconductor Systems