スポンサーリンク
Research Laboratory for Surface Science, Faculty of Science, Okayama University | 論文
- Non-destructive Analysis of Buried Interfaces and Surface Layers: X-Ray Emission Spectroscopic Study
- Valence Band Density of States of Cu_3Si Studied by Soft X-Ray Emission Spectroscopy and a First-Principle Molecular Orbital Calculation(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)
- Study on Ti/C-teminated 4H- and 6H-SiC interface reactions by soft X-ray emission spectroscopy (SXES)
- Analysis of Nanostructure Formation Using Photon/Electron Spectroscopies: Cu on SiC Substrates
- Application of Monte Carlo Simulation to a Structural Analysis for Two-Layered/Substrate System
- Application of Monte Carlo Simulation to Structural Analysis by Soft X-Ray Emission Spectroscopy for a Silicide/Si-Bulk System
- Mn (Thin-Film)/Si (Substrate) Contacts: Analysis of the Buried Interface by Soft X-Ray Emission Spectroscopy
- Valence Band Density of States of the Manganess Silicides Studied by Soft X-Ray Emission Spectroscopy
- Analysis of Heat-Treated 6H-SiC (0001) Surface Using Scanning Tunneling Microscopy
- Study of Cr Silicide Formation on Si(100) Due to Solid-Phase Reaction Using Soft X-Ray Emission Spectroscopy
- Valence Band Density of States of the Iron Silicides Studied by Soft X-Ray Emission Spectroscopy
- Soft X-Ray Emission Spectroscopic Analysis of Pt Silicides (Pt_2Si, PtSi)
- Ni-Silicide Formation : Dependence on Crystallographic Orientation of Si Substrates
- Valence Band Density of States of Palladium Silicides Studied by X-Ray Emission Spectroscopy (XES)
- Nondestructive Depth Profiling Using Soft X-Ray Emission Spectroscopy by Incident Angle Variation Method
- Soft X-Ray Spectroscopic Analysis of Ni-Silicides
- Indistinct Defect Images in Topographs of Nearly Perfect Aluminum Crystals Just Prior to Appearance of Dislocation Loops : Condensed Matter: Structure, etc.
- Application of High-Resolution Film for Lithography to Synchrotron X-Ray Topography
- Positron Trapping Rate into Dislocations in Aluminum
- Nondestructive Observation of Si_Ge_/Ge/ Si_Ge_x Heterostructure Using Soft X-Ray Emission Spectroscopy