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Production Engineering Research Laboratory Hitachi Ltd. | 論文
- Dependence of Lattice Constant Deviation and Refractive Index on Proton Concentration in Proton-Exchanged Optical Waveguides on a Single Crystal of LiNbO_3
- Properties of Diamond-Like Carbon FilmsFabricated by the Filtered Cathodic Vacuum Arc Method
- Modulation Compensation of Circuit Pattern Detection Signals
- A Thresholding Method for Circuit Pattern Images Containing Low Contrast Signals
- Ion Energy Distribution of 13.56 MHz rf Glow Discharges in a Planar System Cathode
- Structural Study of Ultrathin Hydrogenated Amorphous Carbon Films Using Spectroscopic Ellipsometry and Ultraviolet Raman Spectroscopy
- Control of Plasma Parameters for High-Quality Hydrogenated Amorphous Carbon Growth
- Parameter Insensitive Disturbance-Rejection Problem with Incomplete-State Feedback
- A State Space Approach for Distributed Parameter Circuit : Disturbance-Rejection Problem for Infinite-Dimensional Systems (Special Section on Signal Processing and System Theory)
- Influence of Substrates on Initial Growth of Diamond-Like Carbon Films
- Evidence of Ga_2Se_3-Related Compounds on Se-Stabilized GaAs Surfaces
- An Algorithm for the Automatic Generation of Kinematic Chains : Vibration, Control Engineering, Engineering for Industry
- Shot Leveling and Focusing with Interferometry for Optical Lithography of Sub-Half-Micron LSI
- Solder Joint Inspection Using Air Stimulation Speckle Vibration Detection Method and Fluorescence Detection Method (Special Section on Machine Vision Applications)
- Extension of the Hodograph Method for the One-Dimensional Elastic-Plastic Wave Propagation
- Thickness Dependence of Perpendicular Anisotropy in Nickel Films
- Effects of Cholinergic Drugs and Cerebral Metabolic Activators on Memory Impairment in Old Rats
- EPILEPTOGENIC ACTIVITY INDUCED BY INTRAVENOUS INJECTION OF CERTAIN CEPHALOSPORINS IN RATS
- Recognition of Fatal Defects in Circuit Patterns
- Automated Inspection of Printed Circuit Board Patterns Referenced to CAD Data