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Physics Department Tokyo Institute Of Technology | 論文
- 22aT-13 High resolution REM study on structures of high index Si surfaces induced by metal deposition
- Some Properties of Titanium Sesquioxides Containing Vanadium Ions
- Surface Structures Observed by High-Resolution UHV Electron Microscopy at Atomic Level
- Electromechanical Properties of NaNO_2 Single Crystals
- Nuclear Magnetic Resonance of Fe^ in Fine Powdered Iron
- Density vs. Exposure Curves of a Photographic Emulsion for 20〜200kV Electrons
- Relativistic Correction to the Method of Eliminating the Primary Extinction in Electron Diffraction
- Streak Pattern of Electron Diffraction from Single Crystal Films
- Electron Optical Studies of Barium Titanate Single Crystal Films
- Electron-Diffraction Study of the Structure of Supercooled Liquid Bismuth
- X-Ray Topographic Study of the Defects in GaAs Epi-Layers Grown by Liquid Phase Epitaxial Method. II.
- Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy
- New Phase Diagram of Step Instabilities on Si(111) Vicinal Surfaces Induced by DC Annealing : Condensed Matter: Structure, etc.
- Energy-filtered Electron Interferometry in Reflection Electron Microscopy
- Design features of a new ultra-high vacuum electron microscope with an omega filter
- Direct Current Heating Induced Giant Step Bunching and Wandering on Si(111) and (001) Vicinal Surfaces
- Ultra High Vacuum Reflection Electron Microscopy Study of Step-Dislocation Interaction on Si(111) Surface
- UHV-TEM-REM Studies of Si(111) Surfaces
- A New Technique to Produce Clean and Thin Silicon Films In Situ in a UHV Electron Microscope for TEM-TED Studies of Surfaces
- Monolayer and Bilayer High Steps on Si(001)2×1 Vicinal Surface