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Photonic and Wireless Devices Research Labs., NEC Corporation | 論文
- Lateral and Vertical Scaling of High-f_ InP-Based HBTs(Analog Circuit and Device Technologies)
- Robust 0.13-μm Gate HJFET with Low Fringing Capacitance
- High Performance HJFET MMIC with Embedded Gate Technology for Microwave and Millimeter-Wave IC's Using EB Lithography (EMMIE) (Special Issue on High-Frequency/speed Devices in the 21st Century)
- 8 nm Wide Line Fabrication in PMMA on Si Wafers by Electron Beam Exposure
- A Stable High-Brightness Electron Gun with Zr/W-tip for Nanometer Lithography. : I. Emission Properties in Schottky- and Thermal Field-Emission Regions
- Ion Beam Assisted Deposition of Metal Organic Films Using Focused Ion Beams
- GaAs-based high-frequency and high-speed devices
- Low-Crosstalk LD and PD Arrays with Isolated Electrodes for Parallel Optical Communications(Special Issue on Recent Progress in Semiconductor Lasers and Light-Emitting Devices)
- Changes of Volume and Surface Compositions of Polymethylmethacrylate under Electron Beam Irradiation in Lithography