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Optoelectronics And High Frequency Device Research Laboratories Nec Corporation | 論文
- InGaN MQW Lasr Diodes Grown on an n-GaN Substrate with a Backside n-Contact(Special Issue on Blue Laser Diodes and Related Devices/Technologies)
- X-Ray Rocking Curve Determination of Twist and Tilt Angles in GaN Films Grown by an Epitaxial-Lateral-Overgrowth Technique
- Room-Temperature Continuous-Wave Operation of InGaN Multi-Quantum-Well Laser Diodes Grown on an n-GaN Substrate with a Backside n-Contact
- Thick GaN Epitaxial Growth with Low Dislocation Density by Hydride Vapor Phase Epitaxy
- Surface Morphology Study for Hexagonal GaN Grown on GaAs(100) Substrates by Hydride Vapor Phase Epitaxy
- Growth of InN by Chloride-Transport Vapor Phase Epitaxy
- Single Domain Hexagonal GaN Films on GaAs (100) Vicinal Substrates Grown by Hydride Vapor Phase Epitaxy
- Investigations of Local Surface Properties by SNOM Combined with KFM Using a PZT Cantilever(Special Issue on Near-Field Optics and Its Applications)
- Fabrication of Nanometer-Scale Pattern Using Current-Controlled Scanning Probe Lithography
- Experimental Study on Energy Dissipation Induced by Displacement Current in Non-contact Aomic Force Microscopy Imaging of Molecular Thin Films
- Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy
- Structures and Electrical Properties of Fullerene Thin Films on Si(111)-7×7 Surface Investigated by Noncontact Atomic Force Microscopy
- Dynamic Force Microscopy Investigations of C_ Deposited on Si(111) Surface
- The Molecular Arrangements of Alkanethiol Self-Assembled Monolayers on Au(111) Studied by Scanning Tunneling Microscopy
- Structural Study on Self-Assembled Monolayers of Alkanedithiol Molecules
- Theory of Microscopic Mechanism and Related Exotic Phenomena of Scanning Tunneling Microscopy
- Theory of Scanning Tunneling Microscopy/Spectroscopy for Adsorbed Surfaces and Layer Crystal Surfaces
- Second-Harmonic Generation in Smectic A Phase of Ferroelectric Liquid Crystal Induced by Electroclinic Effect
- Highly Reliable SiO_2 Films Formed by UV-O_2 Oxidation
- Highly Reliable SiO_2 Films Formed by UV-O_2 Oxidation