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Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 630-0192, Japan | 論文
- Experimental and Theoretical Analysis of Degradation in Ga2O3–In2O3–ZnO Thin-Film Transistors
- Thermal Analysis of Degradation in Ga2O3–In2O3–ZnO Thin-Film Transistors
- Reliability of Low Temperature Polycrystalline Silicon Thin-Film Transistors with Ultrathin Gate Oxide
- Reliability Analysis of Ultra Low-Temperature Polycrystalline Silicon Thin-Film Transistors
- Low Temperature Polycrystalline Silicon Thin Film Transistors Flash Memory with Silicon Nanocrystal Dot
- Improvement of Reliability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors by Water Vapor Annealing
- Low-temperature Polycrystalline Silicon Thin Film Transistor Flash Memory with Ferritin
- Crystallinity Evaluation by Microwave Photoconductivity Decay in Double-Layered Polycrystalline Silicon Thin Films Crystallized by Solid Green Laser Annealing
- Analysis of Thermal Distribution in Low-Temperature Polycrystalline Silicon p-Channel Thin Film Transistors
- Sputter-Deposited Thin Gate SiO2 Films for High Quality Polycrystalline Silicon Thin Film Transistors