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Kansai Photon Science Institute Japan Atomic Energy Agency | 論文
- Double-Pass Amplification in Ge Soft X-Ray Laser with a Polarizing Half-Cavity
- Generation of Misfit Dislocations in Si_Ge_x/Si Heterostructures
- Dislocation Reduction in MBE-Grown Ge on Si (001) by in situ Thermal Annealing : Condensed Matter
- Misfit Dislocation Structures at MBE-Grown Si_Ge_x/Si Interfaces : Surfaces, Interfaces and Films
- 28aYP-9 対向する2ビームを用いた大強度レーザー航跡場の発生
- Control of Crystalline Structure and Electrical Properties of TaSiN Thin Film Formed by Reactive RF-Sputtering
- Observation of ultrafast spin-lattice relaxation in Tm2+-doped CaF2 and SrF2 crystals by optical means
- 0.56GeV Laser Electron Acceleration in Ablative-Capillary-Discharge Plasma Channel
- Method of observing the spot where full-power counter-propagating laser pulses collide in plasma media
- Observation of actin filaments in leydig cells with a contact-type soft X-ray microscope with laser plasma X-ray source (特集 量子ビームによるナノバイオエレクトロニクス)
- Normal Incidence Multilayer Mirrors for Soft X-Rays (光学薄膜特集号)
- Optical Design for Soft X-Ray Projection Lithography : X-Ray Lithography
- Optical Design for Soft X-Ray Projection Lithography
- Feeling the Texture of Vacuum : Laser Acceleration toward PeV(Cross-Disciplinary Physics)
- Effect of the laser contrast ratio within picosecond timescales on generating a high-quality electron beam by laser-plasma interaction
- Temperature Dependence of TaSiN Thin Film Resistivity from Room Temperature to 900℃ : Semiconductors
- Control of Grain Structure of Sputtering Lead-Zirconate-Titanate Thin Film Using Amorphous Lead-Titanate Buffer Layer
- Characterization of Sputtered Lead-Zirconate-Titanate Thin Films with Various Compositions
- Characterization of Switching Properties of Lead-Zirconate-Titanate Thin Films in Ti-Rich Phase
- Critical Thickness for the Si_Ge_x/Si Heterostructure