スポンサーリンク
Institute of Applied Physics, University of Tsukuba | 論文
- Band Diagrams of BaSi_2/Si Structure by Kelvin Probe and Current-Voltage Characteristics
- Optical Absorption Edge of Ternary Semiconducting Silicide Ba_Sr_xSi_2
- Epitaxial Growth of Semiconducting BaSi_2 Thin Films on Si(111) Substrates by Reactive Deposition Epitaxy
- Epitaxial Growth of Si-Based Ternary Alloy Semiconductor Ba_Sr_xSi_2 Films on Si(111) Substrates by Molecular Beam Epitaxy
- Epitaxial Growth of Semiconducting BaSi_2 Films on Si(111) Substrates by Molecular Beam Epitaxy
- Direct Growth of [100]-Oriented High-Quality β-FeSi_2 Films on Si(001) Substrates by Molecular Beam Epitaxy(Semiconductors)
- Donor and Acceptor Levels in Undoped β-FeSi_2 Films Grown on Si (001) Substrates : Semiconductors
- Room Temperature 1.6 μm Electroluminescence from a Si-Based Light Emitting Diode with β-FeSi_2 Active Region
- Improvement of the Electrical Properties of β-FeSi_2 Films on Si(001)by High-Temperature Annealing
- Growth of Continuous and Highly (100)-Oriented β-FeSi_2 Films on Si(001) from Si/Fe Multilayers with SiO_2 Capping and Templates
- Impurity Effect on the Structural Phase Transition in SrTiO_3 : APPLICATIONS AND FUNDAMENTALS
- 2P348 タンパク質-カーボンナノチューブ複合体およびアミロイド線維による脂質二重膜の破壊(その他,第48回日本生物物理学会年会)
- 2P060 Specific effect of cysteine on prevention of fibril aggregation of amyloid-β and lysozyme(The 48th Annual Meeting of the Biophysical Society of Japan)
- 3P-272 カーボンナノチューブ表面でのタンパク質の吸着と構造変化(その他,第47回日本生物物理学会年会)
- 1P-339 タンパク質を利用したカーボンナノチューブの分散性の向上(その他,第46回日本生物物理学会年会)
- A Scanning X-Ray Fluorescence Microprobe with Synchrotron Radiation
- Adsorption and Wetting Structures of Kr on Pt(111) at 8K and 45K Studied by Scanning Tunneling Microscopy
- Si(111) Surface under Phase Transitions Studied by the Analysis of Inner Layer Structures Using Bias-Dependent Scanning Tunneling Microscopy
- Optical-Phonon Precursory Behavior towards Semiconductor-Metal Transition in Ba_K_xBiO_3 (Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties)
- Production of Reflection Point Sources for Hard X-Ray Gabor Holography