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Institute Of Applied Physics Crest University Of Tsukuba | 論文
- Electronic Structure of the Si(100) Surface A Defects Analyzed by Scanning Tunneling Spectroscopy at 80 K
- Pseudo-Real Time Observation of the Dynamics of Phase Defect on Si(100) Surface
- Origin, Cause, and Electronic Structure of the Symmetric Dimers of Si(100) at 80 K
- Structure Transformation of the C Defects Observed at Low Temperature (80 K)
- Scanning Tunneling Microscopy on Ordered Self-Assemblies of Cyclodextrin lnclusion Complexes Formed by Substrate-Induced Two-Dimensional Crystal Growth
- Surface Superstructures Fluctuating in the Quasi-One-Dimensional Organic Conductor β-(BEDT-TTF)_2PF_6 Observed by Scanning Tunneling Microscopy ( Scanning Tunneling Microscopy)
- Phasons Formed on Si(100) Dimer Rows Observed by Scanning Tunneling Microscopy(STM-Si(100))
- Dynamics of Phasoms; Phase Defects Formed on Dimer Rows and Related Structural Changes of the Si(100) Surface at 80 K Studied by Scanning Tunneling Microscopy
- Phase Transition between c(4 × 2) and p(2 × 2) Structures of the Si(100) Surface at 6 K Caused by the Fluctuation of Phase Defects on Dimer Rows due to Dimer Flip-Flop Motion
- Scanning Tunneling Microscopy and Spectroscopy Studies of Glycine on Cu$(100)$: Inelastic-Tunneling Manipulation of Single Glycine Molecule
- Kelvin Probe Force Microscopy without Bias-Voltage Feedback
- Effect of Defects Buried in Pentacene/Alkanethiol Self-Assembled Monolayer/Au Film on Its Electronic Properties Visualized by Scanning Tunneling Microscopy/Spectroscopy
- Characteristic of the Si(100) Surface Low-Temperature Phase with Two Competing Structures Investigated by Rare Gas Adsorption
- Nanoscale Mapping of Built-in Potential in GaAs p–n Junction Using Light-Modulated Scanning Tunneling Microscopy
- Atomic Force Microscopy on Imogolite, Aluminosilicate Nanotube, Adsorbed on Au(111) Surface