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Graduate School of Advanced Sciences of Matter, Hiroshima University | 論文
- Electronic Properties of Intercalation Compound Fe_xTiS_2
- Low-Voltage and Low-Noise CMOS Analog Circuits Using Scaled Devices(Analog Circuits and Related SoC Integration Technologies)
- Diagnostics of Hydrogen Role in the Si Surface Reaction Processes Employing In-situ Fourier Transform Infrared-Attenuated Total Reflection : Beam Induced Physics and Chemistry
- Diagnostics of Hydrogen Role in the Si Surface Reaction Processes Employing In-situ Fourier Transform Infrared-Attenuated Total Reflection
- Vertical Projection of Surface Velocity Data Using the Variational Assimilation Method with Quasigeostrophic Dynamical Constraints
- Study on Adsorption Behavior of Organic Contaminations on Silicon Surface by Gas Chromatography/Mass Spectrometry
- SOLID STATE ELECTROTRANSPORT OF OXYGEN IN YTTRIUM
- Field Analysis of Two-Dimensional Dynamics of Non-neutral Plasma by Imaging Diagnostics and Examination by Sector Probing
- Propagation of Terahertz Pulses on Coplanar Strip-lines on Low Permittivity Substrates and a Spectroscopy Application
- Electronic and Thermoelectric Properties of the Intermetallic Compounds MNiSn (M = Ti, Zr, and Hf)(Condensed matter : electronic structure and electrical, magnetic, and optical properties)
- Carrier Transport Model for Lateral p-i-n Photodiodes at High-Frequency Operation
- Shot Noise Measurement in p-i-n Diode and Its Analysis
- Surface-Potential-Based MOS-Varactor Model for RF Applications
- Enhanced Quantum Effect for Sub-0.1μm Pocket Technologies and Its Relevance for the On-Current Condition
- Frequency Dependence of Measured MOSFET Distortion Characteristic
- Single Electron Charging to a Si Quantum Dot Floating Gate in MOS Structures
- Quantum Confinement Effect in Self-Assembled, Nanometer Silicon Dots
- Electron Charging to Silicon Quantum Dots as a Floating Gate in MOS Capacitors
- Propagation Characteristics of Terahertz Electrical Signals on Micro-Strip Lines Made of Optically Transparent Conductors
- Electromigration Characteristics of Cu-Al Precipitate in AlCu Interconnection