スポンサーリンク
Faculty of Engineering Tokushima University | 論文
- Charge Carriers Responsible for Thermoluminescent Recombination Process in Heavily Irradiated NaCl
- Water-Induced Plasticity of Sodium Chloride Single Crystals
- Dislocation and Radiation Hardening of NaCl Single Crystals
- Rosette Length and Microhardness of Alkali Halide Crystals
- The Role of Cu^+ in the Thermoluminescence of X-Irradiated NaCl
- CHANGE IN RESIDUAL STRESSES OF TiN FILMS DUE TO ANNEALING TREATMENTS
- A Practical Functional Test Using Flowchart for Production Testing of Microprocessor Based Sequence Controllers (Special Issue on VLSI Testing and Testable Design)
- CMOS Open Defect Detection by Supply Current Measurement under Time-Variable Electric Field Supply(Special Issue on Test and Verification of VLSI)
- Reply to the Comment by Silva and Pizarro
- A Study of Hot Machining : Orthogonal Cutting Mechanism at High Temperature (the Journal and the Transactions of the Japan Society of Mechanical Engineers)
- The Mechanism of Photovoltaic Effect of Ge Film Obliquely Deposited in Vacuum
- The Effect of Short-Wavelength Light in Ge Film Obliquely Deposited in Vacuum
- The Photovoltaic Effect of Ge Films at Low Temperatures
- Identification and Frequency Estimation of Feedback Bridging Faults Generating Logical Oscillation in CMOS Circuits(Fault Detection)(Test and Verification of VLSI)
- Test Sequence Generation for Test Time Reduction of IDDQ Testing(Test Generation and Compaction)(Test and Verification of VLSI)
- Test Pattern Generation for CMOS Open Defect Detection by Supply Current Testing under AC Electric Field(Test)(Dependable Computing)
- Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States(Special Issue on Test and Verification of VLSI)
- Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States(Special Issue on Test and Verification of VLSI)
- Testable Static CMOS PLA for IDDQ Testing(Special Section on Papers Selected from ITC-CSCC 2000)
- Binary and 2^k-Ary Cyclic AN Codes for Burst Error Correction