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Faculty of Engineering, Fukuyama University | 論文
- Power-Sum Estimation of Electromagnetic Noise Radiated from High-Speed CMOS Printed Circuit Boards
- AN ALGORITHM TO FIND ALL SOLUTIONS OF BLIND DECONVOLUTION (Image Processing and Coding)(International Workshop On Advanced Image Technology (IWAIT2004))
- Ribotype Analysis of HAKB (Heterosigma akashiwo-Killing Bacteria) Strains Isolated During Termination Period of a H.akashiwo Bloom Occurred in Osaka Bay
- The Effect of Hemicellulolytic Enzymes on Mesophilic Methane Fermentation
- Active Monomer of Sweet Potato β-Amylasel : Stabilizatin and an Improvdde Preparation Method Using α-Cyclodextrin
- Preparation and Some Properties of Active Monomer of Sweet Potato β-Amylase(Biological Chemistry)
- Comparison of the Enzymatic Isomerization of Glucose Produced by Porcine Serum α-Glucosidase and Rhizopus Glucoamylase(Biological Chemistry)
- Evidence for the Existence of an Active Monomer of Sweet Potato β-Amylase(Biological Chemistry)
- ELIMINATION OF TELOPS IN VIDEOS USING KARHUNEN-LOEVE EXPANSION(International Workshop on Advanced Image Technology 2006)
- Inhibition of Monoamine Oxidase by Extracts of Southeast Asian Plants
- AN INPUT SYSTEM OF CHARACTERS USING A WEB CAMERA AND FINGERTIP'S TRACES(INTERNATIONAL Workshop on Advanced Image Technology 2008)
- EXTRACTION OF SUPERIMPOSITION WHEN THE COLOR OF CHARACTERS ARE SIMILAR TO THE BACKGROUND(International Workshop on Advanced Image Technology 2007)
- An Inhibitor of Acetolactate Synthase from a Microbe
- Ethanol Fermentation of Uncooked Sweet Potato with the Application of Enzymes
- Mode of the Antifungal Action of Chrysodin in Candida albicans(Biological Chemistry)
- Citrinin, an Electron Acceptor Having Antifungal Activity(Biological Chemistry)
- Methane Fermentation of Mangrove Viviparous Buds
- A Streptomyces sp. Effective for Conversion of Cyanide into Thiocyanate
- Formal Verification of Totally Self-Checking Properties of Combinational Circuits
- An Application of Regular Temporal Logic to Verification of Fail-Safeness of a Comparator for Redundant System (Special Issue on VLSI Testing and Testable Design)