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Faculty Of Science And Technology Meijo University | 論文
- Fracture of Al_χGa_N/GaN Heterostructure ; Compositional and Impurity Dependence : Semiconductors
- Solar-Blind UV Photodetectors Based on GaN/AlGaN p-i-n Photodiodes
- Theoretical Analysis of Optical Transverse-Mode Control on GaN-Based Laser Diodes(Special Issue on Blue Laser Diodes and Related Devices/Technologies)
- Performance of GaN-Based Semiconductor Laser with Spectral Broadening due to Compositional Inhomogeneity in GaInN Active Layer
- Experimental Development of Evaluation Equipment for Oil Separator
- The Evolution of Nitride-Based Light-Emitting Devices(Special Issue on Recent Progress in Semiconductor Lasers and Light Emitting Devices)
- Present and Future Nitride-Based Devices
- Feeding habits of stone flounder Platichthys bicoloratus larvae in Mutsu Bay, Japan
- Low-Intensity Ultraviolet Photodetectors Based on AlGaN
- Spontaneous Breaking of the Rotational Symmetry in Dimensionally Reduced Super Yang-Mills Models(Particles and Fields)
- Heteroepitaxial Lateral Overgrowth of GaN on Periodically Grooved Substrates: A New Approach for Growing Low-Dislocation-Density GaN Single Crystals : Semiconductors
- Freestanding Highly Crystalline Single Crystal AlN Substrates Grown by a Novel Closed Sublimation Method
- Development of Atmospheric Pressure Plasma Jet with Slit Nozzle
- The September 2000 Torrential Rain Disaster in the Tokai Region : Investigation of a mountain disaster caused by heavy rain in three prefectures ; Aichi, Gifu and Nagano
- Variations of Elastic Constants on Al-Si Alloys by Solid-solutioning under High Pressure
- Near Field Optical Recording on Azopolymer Using a Sub-Microsecond Pulse(Special Issue on Recent Progress in Organic Molecular Electronics)
- Realization of Nitride-Based Solar Cell on Freestanding GaN Substrate
- Both Surface Removal-Both Surface X-Ray Diffraction Method for Residual Stress Measurement in a Hollow Cylinder
- X-ray Measurement of Residual Stresses in a Plate with Both Surface Diffractions under Single Surface Removal or Both Surface Removal
- Both Surface Inequi-thickness Removal-both Surface X-ray Diffraction Method for Residual Stress Measurement in a Plate