Both Surface Inequi-thickness Removal-both Surface X-ray Diffraction Method for Residual Stress Measurement in a Plate

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概要

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• The authors have proposed a method to measure the residual stress by X-ray on both surface after removing thin layers of equal thicknesses from both surfaces of a plate. In this paper is derived a new method of X-ray after removing inequithickness from both surfaces of a plate. The theories of the formar Single Surface Removal Method and Both Surface Removal Method are derived from the present theory as special cases. The authors applied this method to a quenched and tempered alloy steel plate of SKS 51 and discussed the influence of neglecting the inequality of removal thickness on both surface.

• 一般社団法人日本機械学会の論文

著者

• Imura Takashi

  Faculty Of Science And Technology Meijo University

• DOl Osamu

  Faculty of Engineering, Hokkaido University

• Dol Osamu

  Faculty Of Engineering Hokkaido University

関連論文

• Both Surface Removal-Both Surface X-Ray Diffraction Method for Residual Stress Measurement in a Hollow Cylinder
• X-ray Measurement of Residual Stresses in a Plate with Both Surface Diffractions under Single Surface Removal or Both Surface Removal
• Both Surface Inequi-thickness Removal-both Surface X-ray Diffraction Method for Residual Stress Measurement in a Plate
• Single Surface Removal-Both Surface X-Ray Diffraction Method for Residual Stress Measurement in a Hollow Cylinder

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