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Diamond Research Center, National Institute of Advanced Industrial Science and Technology (AIST) | 論文
- High-Efficiency Excitonic Emission with Deep-Ultraviolet Light from (001)-Oriented Diamond p-i-n Junction
- Selective Growth of Monoatomic Cu Rows at Step Edges on Si(111) Substrates in Ultralow-Dissolved-Oxygen Water
- In Situ Measurements of Drastic Change of Electrical Conductivity and Structure upon Electrochemical Lithium Intercalation in Pyrolyzed Poly(hydrazocarbonyl-1-4-phenylenecarbonyl) Film
- Electron-Beam-Induced Selective Thermal Decomposition of Ultrathin SiO_2 Layers Used in Nanofabrication
- Qualitative Correspondences of Experimentally Obtained Growth Rates and Morphology of Single-Crystal Diamond with Numerical Predictions of Plasma and Gas Dynamics in Microwave Discharges for Various Substrate Holder Shapes
- n-Type Control by Sulfur Ion Implantation in Homoepitaxial Diamond Films Grown by Chemical Vapor Deposition
- High-Quality B-Doped Homoepitaxial Diamond Films using Trimethylboron
- Cu/CaF_2/Diamond Metal-Insulator-Semiconductor Field-Effect Transistor Utilizing Self-Aligned Gate Fabrication Process
- High-Performance Diamond Metal-Semiconductor Field-Effect Transistor with 1 μm Gate Length
- Particle Transport Study with an Electron Beam in the Tohoku University Heliac
- Potential Structure Measurements of ECH Plasma in a Helical Axis Stellarator
- Fabrication of Defect-Free Sub-10nm Si Nanocolumn for Quantum Effect Devices Using Cl Neutral Beam Process
- Preparation of Ferroelectric Thin Films of Bismuth Layer Structured Compounds
- Depolarization Characteristics in Sol-Gel Ferroelectric Pb(Zr_Ti_)O_3 Thin-Film Capacitors
- Characteristics of Bismuth Layered SrBi_2Ta_2O_9 Thin-Film Capacitors and Comparison with Pb(Zr, Ti)O_3
- Origin of Depolarization in Sol-Gel Ferroelectric Pb(Zr_Ti_)O_3 Thin-Film Capacitors
- Characteristic Change Due to Polarization Fatigue of Sol-Gel Ferroelectric Pb(Zr_Ti_)O_3 Thin-Film Capacitors ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Polarization Fatigue Characteristics of Sol-Get Ferroelectric Pb(Zr_Ti_)O_3 Thin-Film Capacitors
- Evaluation of Imprint Properties in Sol-Get Ferroelectric Pb(ZrTi)O_3 Thin-Film Capacitors
- High-Quality CVD/Thermal Stacked Gate Oxide Films with Hydrogen-Free CVD SiO_2 Formed in a SiCl_4-N_2O System