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Department Of Electronic Engineering Faculty Of Engineering Osaka University | 論文
- Actin-Depolymerizing Effect of Dimeric Macrolides, Bistheonellide A and Swinholide A^1
- Novel Actin Depolymerizing Macrolide Aplyronine A
- Cellu8lar Changes of Rat Embryonic Fibroblasts by an Actin-Polymerization Inhibitor, Bistheonellide A, from a Marine Sponge
- Quasi-Static Analysis of Resonant Brillouin Scattering in ZnSe, ZnTe and CdS
- Scalability of Gate/N^- Overlapped Lightly Doped Drain in Deep-Submicrometer Regime
- Subquarter-micrometer Dual Gate Complementary Metal Oxide Semiconductor Field Effect Transistor with Ultrathin Gate Oxide of 2 nm
- Shubnikov de Haas Effect and Energy Band Structure of GaSb
- Isotopic Effect on Thermal Physical Properties of Isotopically Modified Boron Single Crystals
- Dielectric Constants of Surface-Stabilized Ferroelectric Liquid Crystals with Chevron and Quasi-Bookshelf Structures
- Temperature Dependences of Effective Cone Angles of Surface-Stabilized Ferroelectric Liquid Crystal: Correlation with Layer Structure Changes Caused by Electrical Square Waves
- X-Ray Mask Distortion Induced in Back-Etching Preceding Subtractive Fabrication: Resist and Absorber Stress Effect
- Reduction of X-Ray Irradiation-Induced Pattern Displacement of SiN Membranes Usirng H^+ Ion Implantation Technique
- Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope
- WS-02 ATOMIC MANIPULATION AND IDENTIFICATION USING NONCONTACT ATOMIC FORCE MICROSCOPE
- Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy
- Structures of an Oxygen-Deficient TiO_2(110) Surface Studied by Noncontact Atomic Force Microscopy
- Missing Ag Atom on Si(111)√×√-Ag Surface Observed by Noncontact Atomic Force Microscopy
- Optical Near-Field Imaging Using the Kelvin Probe Technique
- New Computed Tomography Algorithm of Electrostatic Force Microscopy Based on the Singular Value Decomposition Combined with the Discrete Fourier Transform
- Simulated Computed Tomography for the Reconstruction of Vacancies Using an Atomic Force Microscope Image