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Department Of Biotechnology Tottori University | 論文
- A New Analog Correlator Circuit for DS-CDMA Wireless Applications
- Error Analysis on Simultaneous Data Transfers in CDMA Wired Interface
- C-12-26 An Auto-sensitivity Control Circuit for DS-CDMA Receiver Circuit
- Influence of N_2O Oxynitridation on Interface Trap Generation in Surface-Channel p-Channel Metal Oxide Semiconductor Field Effect Transistors
- Influence of N_2O-Oxynitridation on Interface Trap Generation in Surface-Channel PMOSFETs
- Temperature Dependence of Electron Mobility in InGaAs/InAlAs Heterostructures
- Display Wall Empowered Visual Mining for CEOP Data Archive(Coordinated Enhanced Observing Period(CEOP))
- Initial CEOP-based Review of the Prediction Skill of Operational General Circulation Models and Land Surface Models(Coordinated Enhanced Observing Period(CEOP))
- Studies of Boron Segregation to {311} Defects in Silicon-Implanted Silicon
- Boron Segregation to {311} Defects Induced by Self-Implantation Damage in Si
- Boron Accumulation in the {311} Defect Region Induced by Self-Implantation into Silicon Substrate
- Impact Excitation of Carriers in Diamond under Extremely High Electric Fields
- Cloning, Sequencing, and Overexpression in Escherichia coli of a Sarcosine Oxidase-Encoding Gene Linked to the Bacillus Creatinase Gene
- Molecular Cloning and High Expression of the Bacillus Creatinase Gene in Escherichia coli
- Molecular Cloning and Expression of a Streptomyces Sarcosine Oxidase Gene in Streptomyces lividans
- Mn and Mg Interdiffusion and Magnetotransport Properties of La_Sr_MnO_3 Films on MgO(100)Substrate
- Hole Trapping and Detrappirug Characteristics Investigated by Substrate Hot-Hole Injection into Oxide of Metal-Oxide-Semiconduetor Structure
- Hot-Hole-Induced Interface State Generation in p-Channel MOSFETs with Thin Gate Oxide
- Evaluation of Spatial Distribution of Hole Traps Using Depleted Gate MOSFETs
- Analytical Device Model of SOI MOSFETs Including Self-Heating Effect