Yamaguchi Takeshi | Semiconductor Technology Academic Research Center, Yokohama 222-0033, Japan

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概要

• 同名の論文著者
• Semiconductor Technology Academic Research Center, Yokohama 222-0033, Japanの論文著者

関連著者

• Yamaguchi Takeshi

  Semiconductor Technology Academic Research Center, Yokohama 222-0033, Japan

• FUJII Takashi

  Graduate School of Engineering, Hokkaido University

• Arita Masashi

  Graduate School Of Engineering Hokkaido University

• Takahashi Yasuo

  Graduate School Of Information Science And Technology Hokkaido Univ.

• Eguchi Kazuhiro

  Semiconductor Company Toshiba Corporation

• Yoshimaru Masaki

  Semiconductor R&d Division Semiconductor Business Group Oki Electric Industry Co. Ltd.

• Sekine Katsuyuki

  Semiconductor Company Toshiba Corporation

• Takayanagi Mariko

  Semiconductor Company Toshiba Corporation

• Nakasaki Yasushi

  Corporate R&D Center, Toshiba Corporation, 8 Shinsugita-cho, Isogo-ku, Yokohama 235-8522, Japan

• MONIWA Masahiro

  Semiconductor Technology Academic Research Center

• Mitani Yuichiro

  Corporate Research and Development Center, Toshiba Corporation, Yokohama 235-8522, Japan

• Hirano Izumi

  Corporate Research & Development Center, Toshiba Corporation, 8 Shinsugita-cho, Isogo-ku, Yokohama 235-8522, Japan

• Kondo Hirofumi

  Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814, Japan

• Kaji Hiromichi

  Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814, Japan

• Fujiwara Ichiro

  Semiconductor Technology Academic Research Center, Yokohama 222-0033, Japan

• Iijima Ryosuke

  Corporate Research and Development Center, Toshiba Corporation, Yokohama 235-8522, Japan

• Takahashi Yasuo

  Graduate School of Engineering, Oita University

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著作論文

• Effects of Electron Current and Hole Current on Dielectric Breakdown in HfSiON Gate Stacks
• The Observation of "Conduction Spot" on NiO Resistance Random Access Memory

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