Seo Yong-Jin | Department of Electrical and Electronic Engineering, Daebul University, 72 Sanhoi, Samho, Youngam, Chonnam-do 526-702, Korea

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概要

• Seo Yong-Jinの詳細を見る
• 同名の論文著者
• Department of Electrical and Electronic Engineering, Daebul University, 72 Sanhoi, Samho, Youngam, Chonnam-do 526-702, Koreaの論文著者

関連著者

• Seo Yong-Jin

  Department of Electrical and Electronic Engineering, Daebul University, 72 Sanhoi, Samho, Youngam, Chonnam-do 526-702, Korea

• Seo Yong-jin

  Department Of Electrical And Electronics Engineering Daebul University

• SEO Yong-Jin

  Department of Electrical Engineering, DAEBUL University

• Kim Sang-yong

  Fab Division Anam Semiconductor Co. Inc.

• LEE Woo-Sun

  Department of Electrical Engineering, CHOSUN University

• Seo Yong-jin

  Department Of Electrical Engineering Daebul University

• Seo Yong-Jin

  Department of Electrical Engineering, Daebul University, Chonnam-do 526-702, Korea

• Park Jin-seong

  Department Of Advanced Materials Engineering Chosun University

• TSU Raphael

  Department of Electrical Engineering, University of North Carolina at Charlotte

• KIM Kil-Ho

  Technology & Product Development Center, MagnaChip Semiconductor Ltd.

• Kim Kil-ho

  Technology & Product Development Center Magnachip Semiconductor Ltd.

• Tsu Raphael

  Department Of Electrical Engineering University Of North Carolina At Charlotte

• Kim Sang-Yong

  FAB Division, ANAM Semiconductor Co., Inc., Kyounggi-do 420-130, Korea

• Lee Woo-Sun

  Department of Electrical Engineering, CHOSUN University, Kwang-Ju 501-759, Korea

• Lee Woo-Sun

  Department of Electrical Engineering, Chosun University, Gwangju 501-759, Korea

• Kim Nam-Hoon

  Research Institute of Energy Resources Technology, Chosun University, Gwangju 501-759, Korea

• Kim Kil-Ho

  Korea Design Center, Leadis Technology, Inc., Kyungki-do 463-954, Korea

• Park Jin-Seong

  Department of New Material Engineering, CHOSUN University, Kwang-Ju 501-759, Korea

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著作論文

• Electronic and Optical Characteristics of Multilayer Nanocrystalline Silicon/Adsorbed Oxygen Superlattice : Semiconductors
• Effects of Various Facility Factors on Chemical Mechanical Polishing Process Defects
• N-Type Extended Drain Silicon Controlled Rectifier ESD Protection Device with High Latchup Immunity for High Voltage Operating I/O Application
• N-Type Extended Drain Silicon Controlled Rectifier Electrostatic Discharge Protection Device for High-Voltage Operating Input/Output Applications
• Effects of Silica Slurry Temperature on Chemical Mechanical Polishing for Tetraethyl Orthosilicate Film
• Motor-Current-Based Real-Time End Point Detection of Shallow-Trench-Isolation Chemical Mechanical Polishing Process Using High-Selectivity Slurry

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