Sugii Nobuyuki | Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-Koigakubo, Kokubunji, Tokyo 185-8601, Japan
スポンサーリンク
概要
- Sugii Nobuyukiの詳細を見る
- 同名の論文著者
- Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-Koigakubo, Kokubunji, Tokyo 185-8601, Japanの論文著者
関連著者
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Hiramoto Toshiro
Institute Of Industrial Science The University Of Tokyo
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Sugii Nobuyuki
Central Research Laboratory Hitachi Ltd.
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Tsuchiya Ryuta
Central Research Laboratory Hitachi Ltd.
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Ishigaki Takashi
Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-koigakubo, Kokubunji, Tokyo 185-8601, Japan
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Morita Yusuke
Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-koigakubo, Kokubunji, Tokyo 185-8601, Japan
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Iwamatsu Toshiaki
Renesas Technology Corp., 4-1 Mizuhara, Itami, Hyogo 664-0005, Japan
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Inoue Yasuo
Renesas Technology Corp., 4-1 Mizuhara, Itami, Hyogo 664-0005, Japan
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Sugii Nobuyuki
Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-Koigakubo, Kokubunji, Tokyo 185-8601, Japan
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Iwamatsu Toshiaki
Renesas Electronics Corporation, Hitachinaka, Ibaraki 312-8504, Japan
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Inoue Yasuo
Renesas Electronics Corporation, Hitachinaka, Ibaraki 312-8504, Japan
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HIRAMOTO Toshiro
Institute Industrial Science, The University of Tokyo
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Ipposhi Takashi
Renesas Technology Corp.
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Kimura Shinichiro
Central Research Laboratory Hitachi Ltd.
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Yoshimoto Hiroyuki
Central Laboratories For Frontier Technology Kirin Holdings Company Limited:(present Office)research
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Oda Hidekazu
Renesas Technology Corp., 4-1 Mizuhara, Itami, Hyogo 664-0005, Japan
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Oda Hidekazu
Renesas Electronics Corporation, Hitachinaka, Ibaraki 312-8504, Japan
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Ipposhi Takashi
Renesas Technology Corp., 4-1 Mizuhara, Itami, Hyogo 664-0005, Japan
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Tsuchiya Ryuta
Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-Koigakubo, Kokubunji, Tokyo 185-8601, Japan
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Yoshimoto Hiroyuki
Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-koigakubo, Kokubunji, Tokyo 185-8601, Japan
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Kimura Shinichiro
Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-Koigakubo, Kokubunji, Tokyo 185-8601, Japan
著作論文
- Evaluation of Threshold-Voltage Variation in Silicon on Thin Buried Oxide Complementary Metal–Oxide–Semiconductor and Its Impact on Decreasing Standby Leakage Current
- Wide-Range Threshold Voltage Controllable Silicon on Thin Buried Oxide Integrated with Bulk Complementary Metal Oxide Semiconductor Featuring Fully Silicided NiSi Gate Electrode