Yamashita Koji | Tokyo City University, Setagaya, Tokyo 158-8557, Japan
スポンサーリンク
概要
関連著者
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Iwai Hiroshi
Frontier Collaborative Research Center Tokyo Institute Of Technology
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Yamashita Koji
Tokyo City University, Setagaya, Tokyo 158-8557, Japan
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Nohira Hiroshi
Tokyo City University, Setagaya, Tokyo 158-8557, Japan
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Kakushima Kuniyuki
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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WATANABE Masato
Tokyo Institute of Technology
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Ahmet Parhat
Frontier Collaborative Research Center Tokyo Institute Of Technology
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Tsutsui Kazuo
Interdisciplinary Graduate School Of Science & Engineering Tokyo Institute Of Technology
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Kakushima Kuniyuki
Interdisciplinary Graduate School Of Science And Technology Tokyo Institute Of Technology
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Natori Kenji
Frontier Research Center, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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Hattori Takeo
Frontier Research Center, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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Hattori Takeo
Frontier Collaborative Research Center, Tokyo Institute of Technology, Yokohama 226-8503, Japan
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Sugii Nobuyuki
Interdisciplinary Graduate School of Science, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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Tsutsui Kazuo
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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Zade Dariush
Frontier Research Center, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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Kanda Takashi
Frontier Research Center, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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Nishiyama Akira
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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Numajiri Yuuya
Tokyo City University, Setagaya, Tokyo 158-8557, Japan
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Iwai Hiroshi
Frontier Research Center Tokyo Institute of Technology, Yokohama 226-8502, Japan
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Sugii Nobuyuki
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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Watanabe Masato
Tokyo City University, Setagaya, Tokyo 158-8557, Japan
著作論文
- Capacitance--Voltage Characterization of La2O3 Metal--Oxide--Semiconductor Structures on In0.53Ga0.47As Substrate with Different Surface Treatment Methods
- Study of High-\kappa/In0.53Ga0.47As Interface by Hard X-ray Photoemission Spectroscopy