TAKEDA Ryuji | Toshiba Ceramics Co., Ltd., Research and Development Center
スポンサーリンク
概要
関連著者
-
TAKEDA Ryuji
Toshiba Ceramics Co., Ltd., Research and Development Center
-
Takeda Ryuji
Toshiba Ceramics Co. Ltd. Research And Development Center
-
Saito Yoshihiko
Toshiba Corp. Semiconductor Materials Engineering Dept.
-
Tsuchiya Norihiko
Toshiba Corp. Semiconductor Materials Engineering Dept.
-
Shirai Hiroshi
Toshiba Ceramics Co. Ltd. Research And Development Center
-
Izunome K
Toshiba Ceramics Co. Ltd. Tokyo Jpn
-
Izunome Koji
Toshiba Ceramics Co. R&d Center
-
HAYASHI Kenro
Toshiba Ceramics, R & D Center
-
FUKUI Hiroyuki
Toshiba Corp., Semiconductor Materials Engineering Dept.
-
KUBOTA Hiroyasu
Toshiba Corp., Semiconductor Materials Engineering Dept.
-
Fukui Hiroyuki
Toshiba Corp. Semiconductor Materials Engineering Dept.
-
Hayashi Kenro
Toshiba Ceramics R & D Center
-
Takeda R
Toshiba Ceramics Co. Ltd. Kanagawa Jpn
著作論文
- Determination of Thickness of Thin Thermal Oxide Layers on Czochralski-Grown Silicon Wafers from their Longitudinal Optical Vibrational Mode
- Dependence of Time Dependent Dielectric Breakdown Characteristics on Mechanism for Silicon Epitaxial Growth on Misoriented Czochralski Silicon Crystal