TAKADA Syozo | ASRC, AIST
スポンサーリンク
概要
関連著者
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KIKKAWA Takamaro
MIRAI, Advanced Semiconductor Research Center, AIST
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吉川 公麿
広島大学:産業総合研究所
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FUJII Nobutoshi
MIRAI-ASET
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Hata Nobuhiro
Asrc Aist
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Hata Nobuhiro
Advanced Semiconductor Research Center (asrc) National Institute Of Advanced Industrial Science And
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Hata Nobuhiro
Advanced Semiconductor Research Center (asrc) National Institute Of Advanced Science And Technology
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Kikkawa Takamaro
Advanced Semiconductor Research Center (asrc) National Institute Of Advanced Industrial Science And
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Kikkawa Takamaro
Mirai Advanced Semiconductor Research Center (asrc) National Institute Of Advanced Industrial Scienc
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Takada Syozo
Advanced Semiconductor Research Center National Institute Of Advanced Industrial Science And Technol
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TAKADA Syozo
ASRC, AIST
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Takada Syozo
Asrc Aist
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Takada Syozo
Advanced Semiconductor Research Center (asrc) National Institute Of Advanced Science And Technology
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Kikkawa Takamaro
Millenium Research For Advanced Information Technology (mirai)-asrc Aist
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Hata Nobuhiro
Advanced Semiconductor Research Center National Institute Of Advanced Industrial Science And Technol
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HATA Nobuhiro
ASRC, AIST
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NAKAYAMA Takahiro
MIRAI-ASET
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Nakayama Takahiro
MIRAI, Association of Super-Advanced Electronics Technologies (ASET), Tsukuba, Ibaraki 305-8569, Japan
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SEINO Yutaka
MIRAI, Advanced Semiconductor Research Center, AIST
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HATA Nobuhiro
MIRAI-Advanced Semiconductor Research Center (ASRC), National Institute of Advanced Industrial Scien
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Seino Yutaka
Advanced Semiconductor Research Center National Institute Of Advanced Industrial Science And Technol
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Hata Nobuhiro
Mirai Advanced Semiconductor Research Center (asrc) National Institute Of Advanced Industrial Scienc
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Seino Yutaka
Mirai Advanced Semiconductor Research Center Aist
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LI Xianying
ASRC, AIST
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HISHIYA Shingo
MIRAI, ASET
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Li Xianying
Asrc Aist
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Hishiya Shingo
Mirai Aset
著作論文
- Nondestructive characterization of temperature-dependent backbone Si-O-Si structure in porous silica films by in-situ Fourier-transform infrared spectroscopy
- Infrared Complex Dielectric Function Analysis for Chemical Bonding Structure of Porous Silica Low Dielectric Constant Films
- Microstructure Characterization of Skeletal Silica in Porous Low-k Films by Infrared Spectroscopic Ellipsometry