TSUCHIYA Toshiaki | NTT LSI Laboratories
スポンサーリンク
概要
関連著者
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TSUCHIYA Toshiaki
NTT LSI Laboratories
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Ino Masayuki
Ntt Lsi Laboratories
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Kado Yuichi
NTT LSI Laboratories
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OHTOMO Yusuke
NTT LSI Laboratories
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YASUDA Sadayuki
NTT LSI Laboratories
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Ohtomo Y
Ntt System Electronics Lab. Atsugi‐shi Jpn
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Inokawa Hiroshi
Ntt Lsi Laboratories
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Kado Yuichi
Ntt Microsystem Integration Laboratories
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MATSUDA Tadahito
NTT LSI Laboratories
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Ohtomo Yusuke
Ntt System Electronics Laboratories
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KADO Yuichi
NTT Microsystem Integration Laboratories, NTT Corporation
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Sakai Tetsushi
Ntt Electronics Technologies Ltd
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DEGUCHI Kimiyoshi
NTT LSI Laboratories
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Kado Yuichi
Ntt Microsystem Integration Laboratories Ntt Corporation
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Ino Masayuki
Ntt Electronics Corp.
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Takeya Ken
Ntt Lsi Laboratories
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Yasuda S
Renesas Device Design Itami‐shi Japan
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Deguchi K
Department Of Electronics And Information Systems Osaka University
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Harada Mitsuru
Ntt Lsi Laboratories
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Tsuchiya T
Ntt Corp. Musashino‐shi Jpn
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Kado Yuichi
NTT LSI Laboratories, 3–1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243–01, Japan
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Yasuda Sadayuki
NTT LSI Laboratories, 3–1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243–01, Japan
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Ohtomo Yusuke
NTT LSI Laboratories, 3–1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243–01, Japan
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Inokawa Hiroshi
NTT LSI Laboratories, 3–1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243–01, Japan
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Tsuchiya Toshiaki
NTT LSI Laboratories, 3–1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243–01, Japan
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Ino Masayuki
NTT LSI Laboratories, 3–1 Morinosato Wakamiya, Atsugi-shi, Kanagawa 243–01, Japan
著作論文
- A 4:1 MUX Circuit Using 1/4 Micron CMOS/SIMOX for High-Speed and Low-Power Applications
- 3-Gb/s CMOS 1:4 MUX and DEMUX ICs
- LSI Applications of 0.25-μm CMOS/SIMOX Technology
- Effects of Synchrotron X-Ray Irradiation on Hot Carrier Reliability in Subquarter-Micrometer NMOSFETs (Special Issue on Sub-Half Micron Si Device and Process Technologies)
- A 4:1 MUX Circuit Using 1/4 Micron CMOS/SIMOX for High-Speed and Low-Power Applications