AMEMIYA Hiroshi | RIKEN (The Institute of Physical and Chemical Research)
スポンサーリンク
概要
関連著者
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AMEMIYA Hiroshi
RIKEN (The Institute of Physical and Chemical Research)
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Suzuki Takanori
RIKEN
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FUCHS Gerhard
Institut fur Plasma Physik Assoc. EURATOM-KFA
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SHIGUEOKA Yoshyuki
RIKEN (The Institute of Physical and Chemical Research)
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ISHII Shigeyuki
RIKEN (The Institute of Physical and Chemical Research)
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雨宮 宏
中央大学大学院理工学部
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雨宮 宏
理化学研究所
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Fuchs G
Kfa Fuelich Deu
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Ishii Shozo
Tokyo Institute Of Technology
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Amemiya Hiroshi
Department Of Experimental Surgery And Bioengineering National Children's Medical Research Cent
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Ishii Shozo
Department Of Electrical And Electronic Engineering Tokyo Instutute Of Technology
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Fuchs Gerhard
Institut Fur Plasmaphysik Kfa Julich Gmbh
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ISHII Shigeyuki
Toyama Prefectural University
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Amemiya H
Inst. Physical And Chemical Res. (riken) Saitama Jpn
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NAKAMURA Yoshiharu
SAS(The Institute of Space and Astronautical Science)
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Ishii S
Univ. Tsukuba Tsukuba Jpn
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Yanokura Minoru
Riken (the Institute Of Physical And Chemical Research)
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Nakamura Y
Sas(the Institute Of Space And Astronautical Science)
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NAKAMURA Yoshiharu
ISAS (The Institute of Space and Astronautical Science)
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Amemiya Hiroshi
Riken(the Institute Of Physical And Chemical Research)
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Nakamura Yoshiharu
Isas(the Institute Of Space And Astronautical Science)
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Suzuki Takanori
Riken (the Institute Of Physical And Chemical Research)
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Amemiya Hiroshi
RIKEN (The Institute of Physical and Chemical Research), Wakoshi, Hirosawa, Saitama 351-01
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Amemiya Hiroshi
RIKEN (The Institute of Physical and Chemical Research), Wako-shi, Hirosawa, Saitama 351-01
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Ishii Shigeyuki
RIKEN (The Institute of Physical and Chemical Research), Wako-shi, Hirosawa, Saitama 351-01
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FUCHS Gerhard
Institut fuer Plasmaphysik, Forschungszentrum Juelich, D-52425, Germany
著作論文
- Multicusp Type Electron Cyclotron Resonance Ion Source for Plasma Processing
- Measurement of Negative Ions in the Lower Ionosphere(D-Layer)in the Polar Regin
- Influence of Secondary Electron Emission on the Characteristics of Langmuir Probes
- Range of Application for Asymmetric Double Probes
- Optogalvanic Measurement of Negative Ions in Plasma by Semiconductor Lasers
- An Optimum Condition of Multipole Field for an ECR-Type Jon Source
- Laser-Assisted Probing Method for Measuring Negative Ions in Plasmas
- Negative Ion-Sensitive Probe : Nuclear Science, Plasmas and Electric Discharges
- Measurement of Negative Ions by Photodetachment with YAG Laser in Discharge Plasmas
- Characteristics of Double Probe in Negative Ion-Containing Plasmas
- Production of Negative Ion-Rich Plasma by Using a Magneric Filter in Oxygen
- Measurement of Negative Ions in the D-Layer by a Sounding Rocket
- Plasma Dispersion for Druyvesteyn Type Velocity Distribution
- Electron Energy Distribution in Multicusp-Type ECR Plasma
- Measuring Method for Ion Temperature by Asymmetric Probes in Magnetic Fields
- Production of Electron-Free Plasma by Using a Magnetic Filter in Radio Frequency Discharge