Hamada K | Ulsi Device Development Laboratories Nec Corporation
スポンサーリンク
概要
関連著者
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Hamada K
Ulsi Device Development Laboratories Nec Corporation
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Kitano T
Tokyo Electron Kyushu Ltd. Kumamoto Jpn
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Miura Y
Ntt Lsi Laboratories
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Kawano T
Osaka Univ. Osaka Jpn
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OGURA Atsushi
Institute of Molecular and Cellular Biosciences, The University of Tokyo
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Ogura A
Nec Corp. Sagamihara Jpn
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Ogura A
Nec Corp. Kanagawa Jpn
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Kawano T
Tokyo Electron Kyushu Ltd. Kumamoto Jpn
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Kitano T
Fundamental Research Laboratories Nec Corporation
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Kitano Tomohisa
Ulsi Device Development Laboratories Nec Corporation
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Kitano T
Ulsi Device Development Laboratories Nec Corporation
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HAMADA Kouichi
ULSI Device Development Laboratories, NEC Corporation
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Fujimori Naoji
Itami Research Laboratories, Sumitomo Electric Industries, Ltd.
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Imai T
Itami Research Laboratories Sumitomo Electric Industries Ltd.
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Imai Takahiro
Itami Research Laboratories Sumitomo Electric Industries Ltd.
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Ogura Atsushi
Silicon Systems Research Laboratories Nec Corporation
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Fujimori N
Sumitomo Electric Ind. Ltd. Hyogo Jpn
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Fujimori Naoji
Itami Research Laboratories Sumitomo Electric Ind. Ltd.
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Imai T
Nippon Telegraph And Telephone Corp. Ibaraki Jpn
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Miura Yoshinao
Silicon Systems Research Laboratories System Devices And Fundamental Research Nec Corporation
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Nishibayashi Yoshiki
Itami Research Laboratories Sumitomo Electric Industries Ltd.
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TSUNO Takashi
Itami Research Laboratories, Sumitomo Electric Industries, Ltd.
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HAMADA Kotaro
Analytical Characterization Center, Sumitomo Electric Industries, Ltd.
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Tsuno Takashi
Itami Research Laboratories Sumitomo Electric Industries Ltd.
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MIURA Yoshinao
Microelectronics Research Laboratories, NEC Corporation
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OGURA Atsushi
Microelectronics Research Laboratories, NEC Corporation
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Tsuno T
Nihon Univ. Chiba Jpn
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Ogura Atsushi
Silicon Systems Research Laboratories Nec Corp.
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Ogura Atsushi
Microelectronics Research Laboratories Nec Corporation
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Ogura Atsushi
Silicon System Research Labs., NEC Corp., 1120 Shimokuzawa, Sagamihara 229-1198, Japan
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Hamada Kotaro
Analysis Technology Research Center, Sumitomo Electric Industries, Ltd., 1 Taya-cho, Sakae-ku, Yokohama 244-8588, Japan
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Imai Takahiro
Itami Laboratory, Sumitomo Electric Industries, Ltd., 1-1-1, Koyakita, Itami, Hyogo 664
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Fujimori Naoji
Itami Laboratory, Sumitomo Electric Industries, Ltd., 1-1-1, Koyakita, Itami, Hyogo 664
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Nishibayashi Yoshiki
Itami Laboratory, Sumitomo Electric Industries, Ltd., 1-1-1, Koyakita, Itami, Hyogo 664
著作論文
- Epitaxially Grown Diamond (001) 2×1/1×2 Surface Investigated by Scanning Tunneling Microscopy in Air
- Evaluation of Electron Trap Levels in SOI Buried Oxides by Transient Photocurrent Spectroscopy
- Evaluation of Electron Trap Levels in SIMOX Buried Oxide by Transient Photocurrent Spectroscopy