Fujieda Shinji | Silicon Systems Research Laboratories Nec Corporation
スポンサーリンク
概要
関連著者
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Fujieda Shinji
Silicon Systems Research Laboratories Nec Corporation
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Miura Yoshinao
Silicon Systems Research Laboratories System Devices And Fundamental Research Nec Corporation
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Fujieda Shinji
Silicon Systems Research Laboratories System Devices And Fundamental Research Nec Corporation
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KOBAYASHI Kenji
Fundamental Research Laboratories, NEC Corporation
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MANABE Kenzo
Silicon Systems Research Laboratories, NEC Corporation
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TATSUMI Toru
Silicon Systems Research Laboratories, NEC Corporation
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Tatsumi Toru
Silicon Systems Research Laboratories Nec Corporation
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Hasegawa Eiji
Ulsi Device Development Division Nec Corporation
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Manabe Kenzo
Silicon Systems Research Laboratories Nec Corporation
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Kobayashi Kenji
Fundamental Research Laboratories Nec Corporation
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Koba Kenji
Fundamental Research Laboratories, NEC Corporation
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Fujieda Shinji
Silicon Systems Research Laboratories, System Devices and Fundamental Research, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501, Japan
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Fujieda Shinji
Silicon Systems Research Laboratories, System Devices and Fundamental Research, NEC Corporation
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Miura Yoshinao
Silicon Systems Research Laboratories, System Devices and Fundamental Research, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501, Japan
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Miura Yoshinao
Silicon Systems Research Laboratories, System Devices and Fundamental Research, NEC Corporation
著作論文
- Mechanism of Leakage Current Reduction by Adding WO_3 to Crystallized Ta_2O_5 : Structure and Mechanical and Thermal Properties of Condensed Matter
- Paramagnetic Defects Related to Positive Charges in Silicon Oxynitride Films
- Spin-Dependent Trap-Assisted Tunneling Current in Ultra-Thin Gate Dielectrics
- Spin-Dependent Trap-Assisted Tunneling Current in Ultra-Thin Gate Dielectrics