Lee Choochon | Department Of Physics Kaist

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著作論文

Determination of the Interface Trap Density in Metal Oxide Semiconductor Field-Effect Transistor through Subthreshold Slope Measurement
Determination of Flat-Band Voltages for Fully Depleted Silicon-on-Insulator (SOI) Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFET's)
ANNEALING BEHAVIOR OF BIAS INDUCED DEGRADATION IN A-SI : H TFTs (Korea-Japan Joint Symposium on Information Display)
Field-Effect Conductance Activation Energy in Polycrystalline Silicon Thin-Film Transistors after Bias Stress
Defect Creation in a-Si:H Thin Film Transistors by Bias-Stress
Microcrystalline Silicon Films Deposited by Electron Cyclotron Resonance Plasma Chemical Vapor Deposition Using Helium Gas
Substrate-Dependent Growth of Polycrystalline Silicon Films Prepared by Plasma-Enhanced Chemical Vapor Deposition Using SiF_4 and H_2 Gases
HIGH PERFORMANCE A-SI TFT PRODUCED BY RP-CVD
Performance and Stability of a-Si:H Thin Film Transistors with SiO_2 Gate Insulator

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