Iguchi Manabu | Nec Electronics Corporation
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概要
関連著者
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Takewaki Toshiyuki
Nec Electronics Corporation
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Iguchi Manabu
Nec Electronics Corporation
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Suzuki Mieko
Nec Electronics Corporation
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Oda Noriaki
Nec Electronics Corp. Kawasaki‐shi Jpn
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YAMADA Kenta
NEC Electronics Corporation
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Yamada Kenta
Nec Electronics Corp. Kawasaki‐shi Jpn
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KAMEYAMA Akiko
NEC Electronics Corporation
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Yamanaga Koh
Integrated Research Institute Tokyo Institute Of Technology
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Sekine Makoto
Nec Electronics Corporation
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Sakamoto Hideo
Nec Electronics Corporation
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KITAHARA Hiroshi
NEC Electronics Corporation
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ASAI Yoshihiko
NEC Electronics Corporation
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OKADA Norio
NEC Electronics Corporation
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YASUDA Makoto
NEC Electronics Corporation
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SAKURAI Michio
NEC Electronics Corporation
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HIROI Masayuki
NEC Electronics Corporation
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OHNISHI Sadayuki
NEC Electronics Corporation
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MINDA Hiroyasu
NEC Electronics Corporation
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UENO Kazuyoshi
Advanced Device Development Division, NEC Electronics Corporation
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KAMEYAMA Akiko
Advanced Device Development Division, NEC Electronics Corporation
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MATSUMOTO Akira
Advanced Device Development Division, NEC Electronics Corporation
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IGUCHI Manabu
Advanced Device Development Division, NEC Electronics Corporation
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TAKEWAKI Toshiyuki
Advanced Device Development Division, NEC Electronics Corporation
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OSHIDA Daisuke
Advanced Device Development Division, NEC Electronics Corporation
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TOYOSHIMA Hironori
Advanced Device Development Division, NEC Electronics Corporation
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KAWAHARA Naoyoshi
Advanced Device Development Division, NEC Electronics Corporation
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ASADA Susumu
Advanced Device Development Division, NEC Electronics Corporation
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SUZUKI Mieko
Advanced Device Development Division, NEC Electronics Corporation
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ODA Noriaki
Advanced Device Development Division, NEC Electronics Corporation
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Yasuda Makoto
Nec Electronics Corp. Kawasaki‐shi Jpn
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Oda Noriaki
Ulsi Device Development Division Nec Corporation
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Kitahara Hiroshi
Nec Electronics Corp. Kawasaki‐shi Jpn
著作論文
- Time-Dependent Dielectric Breakdown Characterization of 90- and 65-nm-Node Cu/SiOC Interconnects with Via Plugs
- Accurate Modeling Method for Cu Interconnect