OSHIDA Daisuke | Advanced Device Development Division, NEC Electronics Corporation

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概要

• 同名の論文著者
• Advanced Device Development Division, NEC Electronics Corporationの論文著者

関連著者

• Takewaki Toshiyuki

  Nec Electronics Corporation

• Iguchi Manabu

  Nec Electronics Corporation

• Suzuki Mieko

  Nec Electronics Corporation

• KAMEYAMA Akiko

  NEC Electronics Corporation

• UENO Kazuyoshi

  Advanced Device Development Division, NEC Electronics Corporation

• KAMEYAMA Akiko

  Advanced Device Development Division, NEC Electronics Corporation

• MATSUMOTO Akira

  Advanced Device Development Division, NEC Electronics Corporation

• IGUCHI Manabu

  Advanced Device Development Division, NEC Electronics Corporation

• TAKEWAKI Toshiyuki

  Advanced Device Development Division, NEC Electronics Corporation

• OSHIDA Daisuke

  Advanced Device Development Division, NEC Electronics Corporation

• TOYOSHIMA Hironori

  Advanced Device Development Division, NEC Electronics Corporation

• KAWAHARA Naoyoshi

  Advanced Device Development Division, NEC Electronics Corporation

• ASADA Susumu

  Advanced Device Development Division, NEC Electronics Corporation

• SUZUKI Mieko

  Advanced Device Development Division, NEC Electronics Corporation

• ODA Noriaki

  Advanced Device Development Division, NEC Electronics Corporation

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著作論文

• Time-Dependent Dielectric Breakdown Characterization of 90- and 65-nm-Node Cu/SiOC Interconnects with Via Plugs

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