LU Wen-Tai | Institute of Electronics, National Chiao-Tung University
スポンサーリンク
概要
関連著者
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Huang T‐y
National Chiao Tung Univ. Hsinchu Twn
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HUANG Tiao-Yuan
Institute of Electronics, National Chiao Tung University
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LU Wen-Tai
Institute of Electronics, National Chiao-Tung University
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HUANG Tiao-Yuan
National Nano Device Laboratory
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LIN Horng-Chih
National Nano Device Labs.
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Huang T-y
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Huang Tiao-yuan
Institute Of Electronics National Chiao Tung University:national Nano Device Laboratories
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Huang Tiao-yuan
Institute Of Electronics National Chiao Tung University
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Lin Horng-chih
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Lin Horng-chih
Institute Of Electronics National Chiao Tung University
著作論文
- Improvements on Electrical Characteristics of p-Channel Metal-Oxide-Semiconductor Field Effect Transistors with HfO_2 Gate Stacks by Post Deposition N_2O Plasma Treatment
- Effects of Fluorine Incorporation on the Negative-Bias-Temperature Instability (NBTI) of P-Channel MOSFETs
- Effects of Fluorine Incorporation on the Negative-Bias-Temperature Instability (NBTI) of P-Channel MOSFETs