LEE Da-Yuan | Institute of Electronics, National Chiao Tung University

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概要

• LEE Da-Yuanの詳細を見る
• 同名の論文著者
• Institute of Electronics, National Chiao Tung Universityの論文著者

関連著者

• HUANG Tiao-Yuan

  National Nano Device Laboratory

• LEE Da-Yuan

  Institute of Electronics, National Chiao Tung University

• Lee Da-yuan

  Institure Of Electronics National Chiao Tung University

• Lin Horng-chih

  National Chiao Tung University

• Huang T‐y

  National Chiao Tung Univ. Hsinchu Twn

• HUANG Tiao-Yuan

  Institute of Electronics, National Chiao Tung University

• LIN Horng-Chih

  National Nano Device Labs.

• Huang T-y

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• Huang Tiao-yuan

  Institute Of Electronics National Chiao Tung University:national Nano Device Laboratories

• Huang Tiao-yuan

  Institute Of Electronics National Chiao Tung University

• Lin Horng-chih

  Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University

• Lin Horng-chih

  Institute Of Electronics National Chiao Tung University

• Lin Horng-chih

  National Nano Device Laboratories

• Lin Horng-chih

  National Nano Device Lab.

• Lee D‐y

  Institute Of Electronics National Chiao Tung University

• Lin Horng-Chin

  National Nano Device Laboratories

• Wang T

  National Chiao Tung Univ. Hsin‐chu Twn

• Tsai Min-yu

  Institute Of Electronics National Chiao Tung University

• LU Wen-Tai

  Institute of Electronics, National Chiao-Tung University

• Wang Meng-feng

  Institute Of Electronics National Chiao Tung University

• Lu Wen-tai

  Institute Of Electronics National Chiao Tung University

• CHIANG Wan-Ju

  Institute of Electronics, National Chiao Tung University

• WANG Tahui

  Institute of Electronics, National Chiao Tung University

• Chiang Wan-ju

  Institute Of Electronics National Chiao Tung University

• Lu Wen-Tai

  National Nano Device Laboratories

• LIN Homg-Chih

  National Nano Device Laboratories

• Huang Tiao-yuan

  National Nano Device Laboratories:institure Of Electronics National Chiao Tung University

• WANG T.

  Institute of Electronics, National Chiao Tung University

• Huang Tiao-yuan

  National Chiao Tung University

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著作論文

• Effects of Fluorine Incorporation on the Negative-Bias-Temperature Instability (NBTI) of P-Channel MOSFETs
• Effects of Fluorine Incorporation on the Negative-Bias-Temperature Instability (NBTI) of P-Channel MOSFETs
• Enhanced Negative-Bias-Temperature Instability of P-Channel Metal-Oxide-Semiconductor Transistors due to Plasma Charging Damage
• Post-Soft-Breakdown Characteristics of Deep Sub-Micron NMOSFETs with Ultra-Thin Gate Oxide
• Enhanced Negative-Bias-Temperature Instability of P-Channel MOSFET by Plasma Charging Damage
• Breakdown Modes and Their Evolution in Ultrathin Gate Oxide

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